Development of secondary breakdown circuit for DV/DT analysis of SIC devices

J. A. Schrock, W. B. Ray, A. V. Bilbao, M. D. Kelley, E. A. Hirsch, S. L. Holt, S. B. Bayne

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

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Engineering & Materials Science