It has long been recognized that μLCR could profitably be done with the high intensity surface beam at LAMPF . A spectrometer has been built that is matched to the LAMPF beam characteristics. The polarization information is obtained from a downstream array of counters while side counters, containing no polarization signal, monitor the μ+ beam. Degraders select higher energy e+, thereby reducing rates and required counter segmentation while maintaining information content. We apply a ramped longitudinal field in addition to the static one to average over instabilities in the μ+ beam. This field scan allows direct interpretation of data and does not require a prior estimate of the resonance structure of a sample. Flux coils monitor the applied ramp field and eddy-current induced fields. High average rate (2×107μ+/s). good stability, and the versatile field scan permitted useful data to be collected from Cu, Al(Cu), Al, Si(Al), and polycrystalline Si targets.