Development of a μLCR facility at LAMPF

M. A. Paciotti, D. W. Cooke, M. Leon, B. L. Bennett, C. Pillai, O. M. Rivera, B. Hitti, T. L. Estle, S. F.J. Cox, R. L. Lichti, T. R. Adams, C. D. Lamp, A. Morrobel-Sosa, O. Richter, C. Boekema, J. Lam, S. Alves, J. Oostens, E. A. Davis

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

It has long been recognized that μLCR could profitably be done with the high intensity surface beam at LAMPF [1]. A spectrometer has been built that is matched to the LAMPF beam characteristics. The polarization information is obtained from a downstream array of counters while side counters, containing no polarization signal, monitor the μ+ beam. Degraders select higher energy e+, thereby reducing rates and required counter segmentation while maintaining information content. We apply a ramped longitudinal field in addition to the static one to average over instabilities in the μ+ beam. This field scan allows direct interpretation of data and does not require a prior estimate of the resonance structure of a sample. Flux coils monitor the applied ramp field and eddy-current induced fields. High average rate (2×107μ+/s). good stability, and the versatile field scan permitted useful data to be collected from Cu, Al(Cu), Al, Si(Al), and polycrystalline Si targets.

Original languageEnglish
Pages (from-to)1111-1116
Number of pages6
JournalHyperfine Interactions
Volume87
Issue number1
DOIs
StatePublished - Dec 1994

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