TY - GEN
T1 - Design of an advanced modular automated evaluation system for experimental high power SGTOs
AU - Lacouture, Shelby
AU - Lawson, Kevin
AU - Bayne, Stephen
AU - Giesselmann, Michael
AU - O'brien, Heather
AU - Ogunniyi, Aderinto
AU - Scozzie, Charles J.
PY - 2013
Y1 - 2013
N2 - An advanced evaluation system for experimental high power Super Gate Turn Off Thyristors (SGTOs) with built - in custom data acquisition and characterization electronics was designed and built in a cooperative agreement between engineers at Texas Tech University's Center for Pulsed Power and Power electronics (P3 E) laboratory and research scientists at Army Research Lab (ARL). The system consist of a Pulse Forming Network (PFN) energized by a rapid capacitor charger, a data acquisition system which records chosen waveforms for each test cycle and a curve tracing module which the test devices are mechanically switched into to record current and voltage characteristics at arbitrary intervals between high power cycles. Testing is completely automated, with all test parameters including charge level, repetition rate, volume, etc. set within a windows based GUI. The evaluation system has successfully recorded changing I - V characteristics before actual physical failure in several devices. Extremely high volume testing has also been carried out with one device having been cycled over 42,000 times at moderate (2.5 kA) conduction levels.
AB - An advanced evaluation system for experimental high power Super Gate Turn Off Thyristors (SGTOs) with built - in custom data acquisition and characterization electronics was designed and built in a cooperative agreement between engineers at Texas Tech University's Center for Pulsed Power and Power electronics (P3 E) laboratory and research scientists at Army Research Lab (ARL). The system consist of a Pulse Forming Network (PFN) energized by a rapid capacitor charger, a data acquisition system which records chosen waveforms for each test cycle and a curve tracing module which the test devices are mechanically switched into to record current and voltage characteristics at arbitrary intervals between high power cycles. Testing is completely automated, with all test parameters including charge level, repetition rate, volume, etc. set within a windows based GUI. The evaluation system has successfully recorded changing I - V characteristics before actual physical failure in several devices. Extremely high volume testing has also been carried out with one device having been cycled over 42,000 times at moderate (2.5 kA) conduction levels.
UR - http://www.scopus.com/inward/record.url?scp=84888627196&partnerID=8YFLogxK
U2 - 10.1109/PPC.2013.6627575
DO - 10.1109/PPC.2013.6627575
M3 - Conference contribution
AN - SCOPUS:84888627196
SN - 9781467351676
T3 - Digest of Technical Papers-IEEE International Pulsed Power Conference
BT - 2013 19th IEEE Pulsed Power Conference, PPC 2013
T2 - 2013 19th IEEE Pulsed Power Conference, PPC 2013
Y2 - 16 June 2013 through 21 June 2013
ER -