Design and test of a W-band photonic bandgap extended interaction Klystron amplifier

Jacob C. Stephens, John C. Tucek, Mark A. Basten, Kenneth E. Kreischer, Michael A. Shapiro, Richard J. Temkin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

This report summarizes the progress of experimental efforts for the development a 94 GHz extended interaction klystron (EIK) with a photonic bandgap (PBG) based interaction structure. Input return loss measurements of the interaction structure are presented, demonstrating the successful fabrication of the input and output cavities of the EIK. Additionally, input return loss and insertion loss measurements of microwave-vacuum feedthrough windows are also presented. Finally, a review of the complete W-band experimental apparatus is given. Hot test experimental efforts for this study are expected to be completed by the 2018IVEC meeting.

Original languageEnglish
Title of host publication2018 IEEE International Vacuum Electronics Conference, IVEC 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages99-100
Number of pages2
ISBN (Electronic)9781538604540
DOIs
StatePublished - Jun 20 2018
Event19th IEEE International Vacuum Electronics Conference, IVEC 2018 - Monterey, United States
Duration: Apr 23 2018Apr 26 2018

Publication series

Name2018 IEEE International Vacuum Electronics Conference, IVEC 2018

Conference

Conference19th IEEE International Vacuum Electronics Conference, IVEC 2018
CountryUnited States
CityMonterey
Period04/23/1804/26/18

Keywords

  • W-band
  • extended interaction klystron (EIK)
  • photonic bandgap (PBG)
  • vacuum electronics

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    Stephens, J. C., Tucek, J. C., Basten, M. A., Kreischer, K. E., Shapiro, M. A., & Temkin, R. J. (2018). Design and test of a W-band photonic bandgap extended interaction Klystron amplifier. In 2018 IEEE International Vacuum Electronics Conference, IVEC 2018 (pp. 99-100). (2018 IEEE International Vacuum Electronics Conference, IVEC 2018). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IVEC.2018.8391585