Fingerprint
Dive into the research topics of 'Demonstration of Constant-Gate-Charge Scaling to Increase the Robustness of Silicon Carbide Power MOSFETs'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Demonstration of Constant-Gate-Charge Scaling to Increase the Robustness of Silicon Carbide Power MOSFETs
James A. Cooper, Dallas T. Morisette, Madankumar Sampath, Cheryl A. Stellman, Stephen B. Bayne, Michael J. Westphal, Clinton H. Anderson, John A. Ransom
Research output: Contribution to journal › Article › peer-review
7
Scopus
citations