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Damage and strain in epitaxial GexSi1-x films irradiated with Si
D. Y.C. Lie, A. Vantomme, F. Eisen, T. Vreeland, M. A. Nicolet, T. K. Carns, V. Arbet-Engels, K. L. Wang
Research output: Contribution to journal › Article › peer-review
50
Scopus
citations