The elemental composition of compost products was determined via inductively coupled plasma atomic emission spectroscopy (ICP) and x-ray fluorescence spectrometry (XRF). Correlations between the two methodologies were evaluated on individual elemental basis to determine if XRF provides results comparable to ICP. Results showed that XRF provides good correlation to ICP on certain EPA-regulated metals such as As, Cu, and Zn. ICP provided better detection of elements at low levels (<5 mg kg−1) in the composted products tested. While XRF cannot achieve the absolute detection limits of ICP, it does show utility as a field screening tool for determining if products fall below EPA mandated metal levels.