Original language | English |
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Pages (from-to) | 241101 |
Journal | Appl. Phys. Lett. |
State | Published - Jun 11 2007 |
Correlation between optoelectronic and structural properties and epilayer thickness of AlN
B. N. Pantha, R. Dahal, M. L. Nakarmi, N. Nepal, J. Li, Jingyu Lin, Hongxing Jiang, Q. S. Paduano, D. Weyburne
Research output: Contribution to journal › Article › peer-review