TY - JOUR
T1 - Controlling crystal orientation in microporous titanosilicate ETS-4 films by secondary growth method
AU - Yilmaz, B.
AU - Shattuck, K. G.
AU - Warzywoda, J.
AU - Sacco, A.
N1 - Funding Information:
The authors acknowledge NASA for financial support.
PY - 2006/5
Y1 - 2006/5
N2 - The secondary growth mechanism of b-out-of-plane oriented ETS-4 films was investigated and conditions were established to effectively decouple nucleation from crystal growth. Supported ETS-4 films were prepared by a two-step hydrothermal synthesis procedure, which included direct crystallization of seed layers on supports followed by secondary growth of seed layers. Porous α-alumina and titania substrates were employed as supports. Rectangular substrates were diagonally placed in 10 mL Teflon-lined stainless steel autoclaves. Both faces of these rectangular substrates had identical surface characteristics. Syntheses were carried out at 448 K for 72 hr. Seed layer syntheses were performed under autoclave rotation (72 rpm), and static hydrothermal conditions were used for secondary growth of these seed layers. FE-SEM, X-ray powder diffraction, and energy dispersive X-ray spectroscopy were used for characterization.
AB - The secondary growth mechanism of b-out-of-plane oriented ETS-4 films was investigated and conditions were established to effectively decouple nucleation from crystal growth. Supported ETS-4 films were prepared by a two-step hydrothermal synthesis procedure, which included direct crystallization of seed layers on supports followed by secondary growth of seed layers. Porous α-alumina and titania substrates were employed as supports. Rectangular substrates were diagonally placed in 10 mL Teflon-lined stainless steel autoclaves. Both faces of these rectangular substrates had identical surface characteristics. Syntheses were carried out at 448 K for 72 hr. Seed layer syntheses were performed under autoclave rotation (72 rpm), and static hydrothermal conditions were used for secondary growth of these seed layers. FE-SEM, X-ray powder diffraction, and energy dispersive X-ray spectroscopy were used for characterization.
UR - http://www.scopus.com/inward/record.url?scp=33744541780&partnerID=8YFLogxK
U2 - 10.1007/s10853-006-6453-7
DO - 10.1007/s10853-006-6453-7
M3 - Article
AN - SCOPUS:33744541780
SN - 0022-2461
VL - 41
SP - 3135
EP - 3138
JO - Journal of Materials Science
JF - Journal of Materials Science
IS - 10
ER -