Coercitivity and its temperature dependence in NdFeB thin films with Cr, Mo, Ti, or Ta buffer layers

H. Jiang, M. J. O'shea

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Abstract

NdFeB thin films of the form [formula omitted] were prepared by magnetron sputtering on a Si(100) substrate. The hard [formula omitted] phase is formed by a postanneal in vacuum. The buffer layers A used are Cr, Mo, Ta, Ti, and NdFeB layer thickness used are 540, 180, 90, and 54 nm. We have found several different combinations of anneal temperature, buffer layer, and NdFeB film thickness d that lead to large coercivity, as high as 17.0 kOe, and energy product, as high as 10.3 MG Oe. The temperature dependence of coercivity was analyzed using a modified Brown's equation and we find that the microstructural parameter [formula omitted] and the effective demagnetization factor [formula omitted] change with the buffer material and anneal temperature. Possible magnetic reversal mechanisms are discussed in light of these results.

Original languageEnglish
Pages (from-to)6131-6133
Number of pages3
JournalJournal of Applied Physics
Volume87
Issue number9
DOIs
StatePublished - May 1 2000

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