Coated silica tips for use in high-pressure, high-temperature, scanning tunneling microscopy

Brandon L. Weeks; Zoe H. Barber; Meera Raval; Mark E. Welland; Trevor Rayment

doi:10.1016/S0304-3991(00)00066-8

Coated silica tips for use in high-pressure, high-temperature, scanning tunneling microscopy

Brandon L. Weeks, Zoe H. Barber, Meera Raval, Mark E. Welland, Trevor Rayment

Chemical Engineering

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

A novel application of coated silica tips for use in high-pressure, high-temperature, scanning tunneling microscopy is introduced. Thermal drift is reduced in the Z-direction due to the low thermal expansion of silica. Virtually, any conducting material that can be evaporated or sputtered can be used as a tip material. Experimental results are shown for tips sputter coated with platinum, along with images obtained.

Original language	English
Pages (from-to)	19-23
Number of pages	5
Journal	Ultramicroscopy
Volume	87
Issue number	1-2
DOIs	https://doi.org/10.1016/S0304-3991(00)00066-8
State	Published - 2001

Keywords

High temperature
In situ studies
STM
Scanning tunneling microscopy

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10.1016/S0304-3991(00)00066-8

Cite this

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title = "Coated silica tips for use in high-pressure, high-temperature, scanning tunneling microscopy",

abstract = "A novel application of coated silica tips for use in high-pressure, high-temperature, scanning tunneling microscopy is introduced. Thermal drift is reduced in the Z-direction due to the low thermal expansion of silica. Virtually, any conducting material that can be evaporated or sputtered can be used as a tip material. Experimental results are shown for tips sputter coated with platinum, along with images obtained.",

keywords = "High temperature, In situ studies, STM, Scanning tunneling microscopy",

author = "Weeks, {Brandon L.} and Barber, {Zoe H.} and Meera Raval and Welland, {Mark E.} and Trevor Rayment",

note = "Funding Information: The authors gratefully thank ICI Synetix SRF and Girton College, Cambridge for funding this work.",

year = "2001",

doi = "10.1016/S0304-3991(00)00066-8",

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volume = "87",

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T1 - Coated silica tips for use in high-pressure, high-temperature, scanning tunneling microscopy

AU - Weeks, Brandon L.

AU - Barber, Zoe H.

AU - Raval, Meera

AU - Welland, Mark E.

AU - Rayment, Trevor

N1 - Funding Information: The authors gratefully thank ICI Synetix SRF and Girton College, Cambridge for funding this work.

PY - 2001

Y1 - 2001

N2 - A novel application of coated silica tips for use in high-pressure, high-temperature, scanning tunneling microscopy is introduced. Thermal drift is reduced in the Z-direction due to the low thermal expansion of silica. Virtually, any conducting material that can be evaporated or sputtered can be used as a tip material. Experimental results are shown for tips sputter coated with platinum, along with images obtained.

AB - A novel application of coated silica tips for use in high-pressure, high-temperature, scanning tunneling microscopy is introduced. Thermal drift is reduced in the Z-direction due to the low thermal expansion of silica. Virtually, any conducting material that can be evaporated or sputtered can be used as a tip material. Experimental results are shown for tips sputter coated with platinum, along with images obtained.

KW - High temperature

KW - In situ studies

KW - STM

KW - Scanning tunneling microscopy

UR - http://www.scopus.com/inward/record.url?scp=0035099516&partnerID=8YFLogxK

U2 - 10.1016/S0304-3991(00)00066-8

DO - 10.1016/S0304-3991(00)00066-8

M3 - Article

C2 - 11310538

AN - SCOPUS:0035099516

SN - 0304-3991

VL - 87

SP - 19

EP - 23

JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 1-2

ER -

Coated silica tips for use in high-pressure, high-temperature, scanning tunneling microscopy

Abstract

Keywords

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