Coated silica tips for use in high-pressure, high-temperature, scanning tunneling microscopy

Brandon L. Weeks, Zoe H. Barber, Meera Raval, Mark E. Welland, Trevor Rayment

Research output: Contribution to journalArticle

1 Scopus citations

Abstract

A novel application of coated silica tips for use in high-pressure, high-temperature, scanning tunneling microscopy is introduced. Thermal drift is reduced in the Z-direction due to the low thermal expansion of silica. Virtually, any conducting material that can be evaporated or sputtered can be used as a tip material. Experimental results are shown for tips sputter coated with platinum, along with images obtained.

Original languageEnglish
Pages (from-to)19-23
Number of pages5
JournalUltramicroscopy
Volume87
Issue number1-2
DOIs
StatePublished - 2001

Keywords

  • High temperature
  • In situ studies
  • STM
  • Scanning tunneling microscopy

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