Characterization of polarization states of surface plasmon polariton modes by Fourier-plane leakage microscopy

S. P. Frisbie, C. J. Regan, A. Krishnan, C. Chesnutt, J. Ajimo, A. A. Bernussi, L. Grave De Peralta

Research output: Contribution to journalArticle

18 Scopus citations

Abstract

We demonstrate that the polarization states of guided wave surface plasmon polariton (SPP) modes can be unambiguously identified by introducing a linear polarizer in the optical path of the light within a leakage-based microscope. We show the use of Fourier-plane leakage-based microscopy as a polarization characterization method to study the polarization states of SPP modes excited in plasmonic waveguides. Our results indicate that the inclusion of a linear polarizer provides additional image processing capabilities to leakage-based microscopes.

Original languageEnglish
Pages (from-to)5255-5260
Number of pages6
JournalOptics Communications
Volume283
Issue number24
DOIs
StatePublished - Dec 15 2010

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