Characterization of intra-bandgap defect states through leakage current analysis for optimization of 4H-SiC photoconductive switches

David Thomas, Daniel Mauch, J. Dickens, A. Neuber

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

A method of characterizing mid-bandgap defect states in high purity semi-insulating 4H-SiC through leakage current analysis for optimization of SiC photoconductive switches is presented. The method utilizes two custom IV curve tracer systems to measure leakage currents through the material under various voltage/current conditions. The first system is used under low current conditions and is capable of measurements from 0 to 45 kV at currents ranging from 0 to 3 mA with pA resolution. A second system measures the transient discharge of a charged capacitor bank through the material. Due to power dissipation concerns, the second system is used for currents higher than 0.1 mA. Voltage/current measurements in this region (>0.1 mA) are of interest due to the information concerning defect states near the conduction band. These shallow defect states are detrimental to switching performance while offering little benefit to voltage hold-off. From the combined data of these two systems, characteristics of the defect states are extracted and presented. We further elucidate the effect of contact annealing temperature on shallow trap levels in electron-beam irradiated material (2∗1018 1/cm2.

Original languageEnglish
Title of host publication2015 IEEE Pulsed Power Conference, PPC 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781479984039
DOIs
StatePublished - Oct 12 2015
EventIEEE Pulsed Power Conference, PPC 2015 - Austin, United States
Duration: May 31 2015Jun 4 2015

Publication series

NameDigest of Technical Papers-IEEE International Pulsed Power Conference
Volume2015-October

Conference

ConferenceIEEE Pulsed Power Conference, PPC 2015
Country/TerritoryUnited States
CityAustin
Period05/31/1506/4/15

Keywords

  • Collaboration
  • Current measurement
  • Decision support systems
  • Government
  • Instruments
  • Ionosphere
  • Physics

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