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Dive into the research topics of 'Characterization of AlN metal-semiconductor-metal diodes in the spectral range of 44–360 nm: Photoemission assessments'. Together they form a unique fingerprint.- Sort by
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A. BenMoussa, J. F. Hochedez, R. Dahal, J. Li, Jingyu Lin, Hongxing Jiang, A. Soltani, J. C. De Jaeger, U. Kroth, M. Richter
Research output: Contribution to journal › Article › peer-review