Original language | English |
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Pages (from-to) | 022108 |
Journal | Appl. Phys. Lett. |
State | Published - Jan 15 2008 |
Characterization of AlN metal-semiconductor-metal diodes in the spectral range of 44–360 nm: Photoemission assessments
A. BenMoussa, J. F. Hochedez, R. Dahal, J. Li, Jingyu Lin, Hongxing Jiang, A. Soltani, J. C. De Jaeger, U. Kroth, M. Richter
Research output: Contribution to journal › Article › peer-review