Caveats of course coordination

Scott Strong, Barbara M. Moskal

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

The Accreditation Board for Engineering and Technology (ABET) accredits eight engineering departments at the Colorado School of Mines (CSM). As a support department, the Mathematical and Computer Sciences Department (MCS) has established an assessment system that relies heavily on coordinated courses. This paper examines the impact of collaboration on student pass rates in the coordinated courses. A comparison is made between the pass rates in the coordinated courses to the pass rates in the non-coordinated courses at the same academic levels. The information gathered from this investigation begins to answer the important question as to whether coordination is an effective mechanism for ensuring quality across multiple course sections. An analysis is also presented on the engineering curriculum at CSM to determine the impact that failure within a given courses has on students' progression toward an engineering degree.

Original languageEnglish
Title of host publication36th ASEE/IEEE Frontiers in Education Conference, FIE
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages4-8
Number of pages5
ISBN (Print)1424402565, 9781424402564
DOIs
StatePublished - 2006
Event36th ASEE/IEEE Frontiers in Education Conference, FIE - San Diego, CA, United States
Duration: Oct 28 2006Oct 31 2006

Publication series

NameProceedings - Frontiers in Education Conference, FIE
ISSN (Print)1539-4565

Conference

Conference36th ASEE/IEEE Frontiers in Education Conference, FIE
CountryUnited States
CitySan Diego, CA
Period10/28/0610/31/06

Keywords

  • Accreditation
  • Assessment
  • Mathematics
  • Student learning

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  • Cite this

    Strong, S., & Moskal, B. M. (2006). Caveats of course coordination. In 36th ASEE/IEEE Frontiers in Education Conference, FIE (pp. 4-8). [4117229] (Proceedings - Frontiers in Education Conference, FIE). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/FIE.2006.322604