Breakdown of dielectric/vacuum interfaces caused by high power microwaves

A. Neuber; J. Dickens; D. Hemmert; H. Krompholz; L. L. Hatfield; M. Kristiansen

Breakdown of dielectric/vacuum interfaces caused by high power microwaves

A. Neuber, J. Dickens, D. Hemmert, H. Krompholz, L. L. Hatfield, M. Kristiansen

Electrical and Computer Engineering

Research output: Contribution to journal › Conference article › peer-review

1 Scopus citations

Abstract

The physical mechanisms leading to microwave breakdown on dielectric/vacuum interfaces are investigated for power levels on the order of 100 MW at 2.85 GHz. Breakdown started at the field enhancement tips at electric field levels of around 20 kV/cm. The final breakdown showed several distinct breakdown channels originating from the field enhancement tips. The pre-breakdown phase was characterized by a very broadband spectrum, typical for cathodoluminescence. At the moment of breakdown, atomic hydrogen lines showed up which was followed by atomic lines of carbon. The final breakdown, which changed the electrical length of the traveling wave resonator, took place in a gas cloud above the dielectric surface.

Original language	English
Pages (from-to)	205
Number of pages	1
Journal	IEEE International Conference on Plasma Science
State	Published - 1998
Event	Proceedings of the 1998 IEEE International Conference on Plasma Science - Raleigh, NC, USA Duration: Jun 1 1998 → Jun 4 1998

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title = "Breakdown of dielectric/vacuum interfaces caused by high power microwaves",

abstract = "The physical mechanisms leading to microwave breakdown on dielectric/vacuum interfaces are investigated for power levels on the order of 100 MW at 2.85 GHz. Breakdown started at the field enhancement tips at electric field levels of around 20 kV/cm. The final breakdown showed several distinct breakdown channels originating from the field enhancement tips. The pre-breakdown phase was characterized by a very broadband spectrum, typical for cathodoluminescence. At the moment of breakdown, atomic hydrogen lines showed up which was followed by atomic lines of carbon. The final breakdown, which changed the electrical length of the traveling wave resonator, took place in a gas cloud above the dielectric surface.",

author = "A. Neuber and J. Dickens and D. Hemmert and H. Krompholz and Hatfield, {L. L.} and M. Kristiansen",

year = "1998",

language = "English",

pages = "205",

journal = "IEEE International Conference on Plasma Science",

issn = "0730-9244",

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TY - JOUR

T1 - Breakdown of dielectric/vacuum interfaces caused by high power microwaves

AU - Neuber, A.

AU - Dickens, J.

AU - Hemmert, D.

AU - Krompholz, H.

AU - Hatfield, L. L.

AU - Kristiansen, M.

PY - 1998

Y1 - 1998

N2 - The physical mechanisms leading to microwave breakdown on dielectric/vacuum interfaces are investigated for power levels on the order of 100 MW at 2.85 GHz. Breakdown started at the field enhancement tips at electric field levels of around 20 kV/cm. The final breakdown showed several distinct breakdown channels originating from the field enhancement tips. The pre-breakdown phase was characterized by a very broadband spectrum, typical for cathodoluminescence. At the moment of breakdown, atomic hydrogen lines showed up which was followed by atomic lines of carbon. The final breakdown, which changed the electrical length of the traveling wave resonator, took place in a gas cloud above the dielectric surface.

AB - The physical mechanisms leading to microwave breakdown on dielectric/vacuum interfaces are investigated for power levels on the order of 100 MW at 2.85 GHz. Breakdown started at the field enhancement tips at electric field levels of around 20 kV/cm. The final breakdown showed several distinct breakdown channels originating from the field enhancement tips. The pre-breakdown phase was characterized by a very broadband spectrum, typical for cathodoluminescence. At the moment of breakdown, atomic hydrogen lines showed up which was followed by atomic lines of carbon. The final breakdown, which changed the electrical length of the traveling wave resonator, took place in a gas cloud above the dielectric surface.

UR - http://www.scopus.com/inward/record.url?scp=0031624689&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:0031624689

SP - 205

JO - IEEE International Conference on Plasma Science

JF - IEEE International Conference on Plasma Science

SN - 0730-9244

Y2 - 1 June 1998 through 4 June 1998

ER -