Best Student Paper Award Winner: “A Novel RF Phase Error Built-in-Self-Test for GSM”, D. Webster, R. Hudgens, L. Phan, O. Eliezer, and D.Y.C. Lie, Proc. IEEE International Conference on Solid-State and Integrated-Circuit Technology (ICSICT), Beijing, pp. 2075-2078, Oct. 20-23 (2008)

Yu-Chun Lie

Best Student Paper Award Winner: “A Novel RF Phase Error Built-in-Self-Test for GSM”, D. Webster, R. Hudgens, L. Phan, O. Eliezer, and D.Y.C. Lie, Proc. IEEE International Conference on Solid-State and Integrated-Circuit Technology (ICSICT), Beijing, pp. 2075-2078, Oct. 20-23 (2008)

Electrical and Computer Engineering

Research output: Contribution to conference › Paper › peer-review

Abstract

38. Best Student Paper Award Winner: “A Novel RF Phase Error Built-in-Self-Test for GSM”, D. Webster, R. Hudgens, L. Phan, O. Eliezer, and D.Y.C. Lie, Proc. IEEE International Conference on Solid-State and Integrated-Circuit Technology (ICSICT), Beijing, pp. 2075-2078, Oct. 20-23 (2008)

Original language	English
State	Published - Oct 2008

Fingerprint

Dive into the research topics of 'Best Student Paper Award Winner: “A Novel RF Phase Error Built-in-Self-Test for GSM”, D. Webster, R. Hudgens, L. Phan, O. Eliezer, and D.Y.C. Lie, Proc. IEEE International Conference on Solid-State and Integrated-Circuit Technology (ICSICT), Beijing, pp. 2075-2078, Oct. 20-23 (2008)'. Together they form a unique fingerprint.

Cite this

@conference{f2c22920a8174982b7831c8db692dd4c,

title = "Best Student Paper Award Winner: “A Novel RF Phase Error Built-in-Self-Test for GSM”, D. Webster, R. Hudgens, L. Phan, O. Eliezer, and D.Y.C. Lie, Proc. IEEE International Conference on Solid-State and Integrated-Circuit Technology (ICSICT), Beijing, pp. 2075-2078, Oct. 20-23 (2008)",

abstract = "38. Best Student Paper Award Winner: “A Novel RF Phase Error Built-in-Self-Test for GSM”, D. Webster, R. Hudgens, L. Phan, O. Eliezer, and D.Y.C. Lie, Proc. IEEE International Conference on Solid-State and Integrated-Circuit Technology (ICSICT), Beijing, pp. 2075-2078, Oct. 20-23 (2008)",

author = "Yu-Chun Lie",

year = "2008",

month = oct,

language = "English",

}

Best Student Paper Award Winner: “A Novel RF Phase Error Built-in-Self-Test for GSM”, D. Webster, R. Hudgens, L. Phan, O. Eliezer, and D.Y.C. Lie, Proc. IEEE International Conference on Solid-State and Integrated-Circuit Technology (ICSICT), Beijing, pp. 2075-2078, Oct. 20-23 (2008). / Lie, Yu-Chun.
2008.

Research output: Contribution to conference › Paper › peer-review

TY - CONF

T1 - Best Student Paper Award Winner: “A Novel RF Phase Error Built-in-Self-Test for GSM”, D. Webster, R. Hudgens, L. Phan, O. Eliezer, and D.Y.C. Lie, Proc. IEEE International Conference on Solid-State and Integrated-Circuit Technology (ICSICT), Beijing, pp. 2075-2078, Oct. 20-23 (2008)

AU - Lie, Yu-Chun

PY - 2008/10

Y1 - 2008/10

N2 - 38. Best Student Paper Award Winner: “A Novel RF Phase Error Built-in-Self-Test for GSM”, D. Webster, R. Hudgens, L. Phan, O. Eliezer, and D.Y.C. Lie, Proc. IEEE International Conference on Solid-State and Integrated-Circuit Technology (ICSICT), Beijing, pp. 2075-2078, Oct. 20-23 (2008)

AB - 38. Best Student Paper Award Winner: “A Novel RF Phase Error Built-in-Self-Test for GSM”, D. Webster, R. Hudgens, L. Phan, O. Eliezer, and D.Y.C. Lie, Proc. IEEE International Conference on Solid-State and Integrated-Circuit Technology (ICSICT), Beijing, pp. 2075-2078, Oct. 20-23 (2008)

M3 - Paper

ER -