Best Student Paper Award Winner: “A Novel RF Phase Error Built-in-Self-Test for GSM”, D. Webster, R. Hudgens, L. Phan, O. Eliezer, and D.Y.C. Lie, Proc. IEEE International Conference on Solid-State and Integrated-Circuit Technology (ICSICT), Beijing, pp. 2075-2078, Oct. 20-23 (2008)

Research output: Contribution to conferencePaperpeer-review

Abstract

38. Best Student Paper Award Winner: “A Novel RF Phase Error Built-in-Self-Test for GSM”, D. Webster, R. Hudgens, L. Phan, O. Eliezer, and D.Y.C. Lie, Proc. IEEE International Conference on Solid-State and Integrated-Circuit Technology (ICSICT), Beijing, pp. 2075-2078, Oct. 20-23 (2008)
Original languageEnglish
StatePublished - Oct 2008

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