“Behavior Modeling and Comparison of Envelope Tracking vs. Envelope-Elimination-and-Restoration for Class E SiGe PA Linearization”, Y. Li, J. Lopez and D.Y.C. Lie, i-manager’s Journal on Electrical Engineering, special issue on “VLSI systems and Applications”, Vol. 1, Issue 4, pp. 15-21 (2008)

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Abstract

22. “Behavior Modeling and Comparison of Envelope Tracking vs. Envelope-Elimination-and-Restoration for Class E SiGe PA Linearization”, Y. Li, J. Lopez and D.Y.C. Lie, i-manager’s Journal on Electrical Engineering, special issue on “VLSI systems and Applications”, Vol. 1, Issue 4, pp. 15-21 (2008)

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