Avalanche breakdown energy in silicon carbide junction field effect transistors

Miguel Hinojosa, Stephen Bayne, Victor Veliadis, Damian Urciuoli

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Fingerprint Dive into the research topics of 'Avalanche breakdown energy in silicon carbide junction field effect transistors'. Together they form a unique fingerprint.

Physics & Astronomy

Chemical Compounds

Engineering & Materials Science