TY - JOUR
T1 - Assessing Lock-On Physics in Semi-Insulating GaAs and InP Photoconductive Switches Triggered by Subbandgap Excitation
AU - Chowdhury, Animesh R.
AU - Ness, Richard
AU - Joshi, Ravi P.
N1 - Publisher Copyright:
© 1963-2012 IEEE.
PY - 2018/9
Y1 - 2018/9
N2 - The time-dependent photocurrent response in semi-insulating GaAs and InP was studied based on 1-D, time-dependent simulations with a focus on the Lock-On phenomenon. The results underscore the role of trap-to-band impact ionization from deep traps in rapid charge creation and its subsequent propagation much like a streamer. The numerical results compare well with the actual data. The main findings are that deeper traps nearer the valence band at higher densities, materials with larger high-field drift velocity, and cathode-side illumination would all aid in attaining Lock-On. These could be useful guidelines for producing Lock-On in new materials such as GaN for high-power applications.
AB - The time-dependent photocurrent response in semi-insulating GaAs and InP was studied based on 1-D, time-dependent simulations with a focus on the Lock-On phenomenon. The results underscore the role of trap-to-band impact ionization from deep traps in rapid charge creation and its subsequent propagation much like a streamer. The numerical results compare well with the actual data. The main findings are that deeper traps nearer the valence band at higher densities, materials with larger high-field drift velocity, and cathode-side illumination would all aid in attaining Lock-On. These could be useful guidelines for producing Lock-On in new materials such as GaN for high-power applications.
KW - Lock-on
KW - modeling
KW - persistent photoconductivity
KW - photoconductive switch
KW - pulsed power application
KW - semi-insulating semiconductors
UR - http://www.scopus.com/inward/record.url?scp=85050996266&partnerID=8YFLogxK
U2 - 10.1109/TED.2018.2856803
DO - 10.1109/TED.2018.2856803
M3 - Article
AN - SCOPUS:85050996266
SN - 0018-9383
VL - 65
SP - 3922
EP - 3929
JO - IEEE Transactions on Electron Devices
JF - IEEE Transactions on Electron Devices
IS - 9
M1 - 8423685
ER -