Anisotropic index of refraction and structural properties of hexagonal boron nitride epilayers probed by spectroscopic ellipsometry

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@article{14e6ed076ded4d7cb5cd13ce1d9c8a71,

title = "Anisotropic index of refraction and structural properties of hexagonal boron nitride epilayers probed by spectroscopic ellipsometry",

author = "McKay, {M. A.} and Jing Li and Jingyu Lin and Hongxing Jiang",

year = "2020",

month = feb,

day = "7",

doi = "10.1063/1.5134908",

language = "English",

pages = "053103",

journal = "J. Appl. Phys.",

issn = "0021-8979",

publisher = "AIP Publishing",

}

TY - JOUR

T1 - Anisotropic index of refraction and structural properties of hexagonal boron nitride epilayers probed by spectroscopic ellipsometry

AU - McKay, M. A.

AU - Li, Jing

AU - Lin, Jingyu

AU - Jiang, Hongxing

PY - 2020/2/7

Y1 - 2020/2/7

U2 - 10.1063/1.5134908

DO - 10.1063/1.5134908

M3 - Article

SP - 053103

JO - J. Appl. Phys.

JF - J. Appl. Phys.

SN - 0021-8979

ER -