Original language | English |
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Pages (from-to) | 053103 |
Journal | J. Appl. Phys. |
DOIs | |
State | Published - Feb 7 2020 |
Anisotropic index of refraction and structural properties of hexagonal boron nitride epilayers probed by spectroscopic ellipsometry
M. A. McKay, Jing Li, Jingyu Lin, Hongxing Jiang
Research output: Contribution to journal › Article › peer-review