Analysis of sticky cotton yarn defects by scanning electron microscopy

Research output: Contribution to specialist publicationArticle

Abstract

Scanning Electron Microscopy (SEM) technique provides a useful solution for investigating the origin of yarn defects observed during the processing of cotton contaminated with insect sugars. Cotton, which is contaminated with stickiness caused by excess sugars on the lint, effects the quality of yarn and the textile mill's productivity. The stickiness results in the unevenness in the flow of fibers being drawn, affecting the quality of yarn, whereas, the low productivity is caused due to an increase in the cleaning schedule. This SEM technique helps in the morphological examination of the yarn defect, which is a key aspect in the study of the effect of temperature increase on the sugar properties. SEM is also used to distinguish between the type of cotton contamination. Differential Scanning Calorimetry (DSC), along with SEM, has shown trehalulose as a sugar type which accumulates on the frames. Trehalulose is highly hygroscopic and absorbs ∼17.5% of water at 65%±2% relative humidity, and is present at the origin of the glue-like substance observed in the yarn.

Original languageEnglish
Pages2-4
Number of pages3
No1
Specialist publicationTextile Topics
StatePublished - Dec 2004

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