TY - JOUR
T1 - An open circuit voltage decay system for performing injection dependent lifetime spectroscopy
AU - Lacouture, Shelby
AU - Schrock, James
AU - Hirsch, Emily
AU - Bayne, Stephen
AU - O'Brien, Heather
AU - Ogunniyi, Aderinto A.
N1 - Funding Information:
We would like to thank the Army Research Laboratory (Contract No. W911NF-14-2-0069) for supporting this work and for lending their technical expertise.
Publisher Copyright:
© 2017 Author(s).
PY - 2017/9/1
Y1 - 2017/9/1
N2 - Of all of the material parameters associated with a semiconductor, the carrier lifetime is by far the most complex and dynamic, being a function of the dominant recombination mechanism, the equilibrium number of carriers, the perturbations in carriers (e.g., carrier injection), and the temperature, to name the most prominent variables. The carrier lifetime is one of the most important parameters in bipolar devices, greatly affecting conductivity modulation, on-state voltage, and reverse recovery. Carrier lifetime is also a useful metric for device fabrication process control and material quality. As it is such a dynamic quantity, carrier lifetime cannot be quoted in a general range such as mobility; it must be measured. The following describes a stand-alone, wide-injection range open circuit voltage decay system with unique lifetime extraction algorithms. The system is initially used along with various lifetime spectroscopy techniques to extract fundamental recombination parameters from a commercial high-voltage PIN diode.
AB - Of all of the material parameters associated with a semiconductor, the carrier lifetime is by far the most complex and dynamic, being a function of the dominant recombination mechanism, the equilibrium number of carriers, the perturbations in carriers (e.g., carrier injection), and the temperature, to name the most prominent variables. The carrier lifetime is one of the most important parameters in bipolar devices, greatly affecting conductivity modulation, on-state voltage, and reverse recovery. Carrier lifetime is also a useful metric for device fabrication process control and material quality. As it is such a dynamic quantity, carrier lifetime cannot be quoted in a general range such as mobility; it must be measured. The following describes a stand-alone, wide-injection range open circuit voltage decay system with unique lifetime extraction algorithms. The system is initially used along with various lifetime spectroscopy techniques to extract fundamental recombination parameters from a commercial high-voltage PIN diode.
UR - http://www.scopus.com/inward/record.url?scp=85029500016&partnerID=8YFLogxK
U2 - 10.1063/1.5001732
DO - 10.1063/1.5001732
M3 - Article
AN - SCOPUS:85029500016
VL - 88
JO - Review of Scientific Instruments
JF - Review of Scientific Instruments
SN - 0034-6748
IS - 9
M1 - 095105
ER -