An Enhanced and Efficient approach to perform Temperature Characterization for Packaged Integrated Circuits using On-chip Electrostatic Discharge Protection Diodes

Ashish Ahuja, Brian Nutter, Richard Gale, Matt Beach, Greg Romas, Terry Jesper

Research output: Other contributionpeer-review

Original languageEnglish
PublisherTTU
StatePublished - Apr 2009

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