A method is presented that uses the well-understood O2/Ax ion-molecule reaction system to determine the effective ion source residence time of a chemical ionization source. The process consists of: (1) defining the kinetic system in terms of reactions, reaction rates, and ionization cross sections; (2) solving the differential equations that describe the time evolu-tion of the kinetic system, and (3) comparing the calculated results to experimentally measured relative ion intensities. These steps are repeated for a variety of 02/Ar sample ratios and inlet pressures. The method leads to a simple relationship between inlet pressure and effective ion source residence time, independent of the 02/Ar sample ratio.
|Number of pages
|Journal of the American Society for Mass Spectrometry
|Published - Oct 1993