@inproceedings{6fe91181e5e14f5fa72ae23a4db0f96e,
title = "A novel RF phase error built-in-self-test for GSM",
abstract = "This paper discusses a novel RF Built-in-Self-Test (RF-BiST) targeting to replace the traditionally expensive and time-consuming RF parametric phase error test on a GSM/EDGE Digital Radio Processor (DRP) radio transceiver. The verification of the RF BiST in a production environment and a comparison of the internal BiST vs. the current test in are presented, which validates the RF BiST as an accepted test method for determining the phase error of GSM devices. The results illustrate that there are great opportunities in reduction of test time and costs by moving to the internal digital method of BiST for testing RF/analog IC products. copy; 2008 IEEE.",
author = "D. Webster and R. Hudgens and L. Phan and O. Eliezer and Lie, {D. Y.C.}",
year = "2008",
doi = "10.1109/ICSICT.2008.4734985",
language = "English",
isbn = "9781424421855",
series = "International Conference on Solid-State and Integrated Circuits Technology Proceedings, ICSICT",
pages = "2075--2078",
booktitle = "ICSICT 2008 - 2008 9th International Conference on Solid-State and Integrated-Circuit Technology Proceedings",
note = "null ; Conference date: 20-10-2008 Through 23-10-2008",
}