TY - GEN
T1 - A novel RF phase error built-in-self-test for GSM
AU - Webster, D.
AU - Hudgens, R.
AU - Phan, L.
AU - Eliezer, O.
AU - Lie, D. Y.C.
PY - 2008
Y1 - 2008
N2 - This paper discusses a novel RF Built-in-Self-Test (RF-BiST) targeting to replace the traditionally expensive and time-consuming RF parametric phase error test on a GSM/EDGE Digital Radio Processor (DRP) radio transceiver. The verification of the RF BiST in a production environment and a comparison of the internal BiST vs. the current test in are presented, which validates the RF BiST as an accepted test method for determining the phase error of GSM devices. The results illustrate that there are great opportunities in reduction of test time and costs by moving to the internal digital method of BiST for testing RF/analog IC products. copy; 2008 IEEE.
AB - This paper discusses a novel RF Built-in-Self-Test (RF-BiST) targeting to replace the traditionally expensive and time-consuming RF parametric phase error test on a GSM/EDGE Digital Radio Processor (DRP) radio transceiver. The verification of the RF BiST in a production environment and a comparison of the internal BiST vs. the current test in are presented, which validates the RF BiST as an accepted test method for determining the phase error of GSM devices. The results illustrate that there are great opportunities in reduction of test time and costs by moving to the internal digital method of BiST for testing RF/analog IC products. copy; 2008 IEEE.
UR - http://www.scopus.com/inward/record.url?scp=60749107555&partnerID=8YFLogxK
U2 - 10.1109/ICSICT.2008.4734985
DO - 10.1109/ICSICT.2008.4734985
M3 - Conference contribution
AN - SCOPUS:60749107555
SN - 9781424421855
T3 - International Conference on Solid-State and Integrated Circuits Technology Proceedings, ICSICT
SP - 2075
EP - 2078
BT - ICSICT 2008 - 2008 9th International Conference on Solid-State and Integrated-Circuit Technology Proceedings
T2 - 2008 9th International Conference on Solid-State and Integrated-Circuit Technology, ICSICT 2008
Y2 - 20 October 2008 through 23 October 2008
ER -