A novel RF phase error built-in-self-test for GSM

D. Webster, R. Hudgens, L. Phan, O. Eliezer, D. Y.C. Lie

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

This paper discusses a novel RF Built-in-Self-Test (RF-BiST) targeting to replace the traditionally expensive and time-consuming RF parametric phase error test on a GSM/EDGE Digital Radio Processor (DRP) radio transceiver. The verification of the RF BiST in a production environment and a comparison of the internal BiST vs. the current test in are presented, which validates the RF BiST as an accepted test method for determining the phase error of GSM devices. The results illustrate that there are great opportunities in reduction of test time and costs by moving to the internal digital method of BiST for testing RF/analog IC products. copy; 2008 IEEE.

Original languageEnglish
Title of host publicationICSICT 2008 - 2008 9th International Conference on Solid-State and Integrated-Circuit Technology Proceedings
Pages2075-2078
Number of pages4
DOIs
StatePublished - 2008
Event2008 9th International Conference on Solid-State and Integrated-Circuit Technology, ICSICT 2008 - Beijing, China
Duration: Oct 20 2008Oct 23 2008

Publication series

NameInternational Conference on Solid-State and Integrated Circuits Technology Proceedings, ICSICT

Conference

Conference2008 9th International Conference on Solid-State and Integrated-Circuit Technology, ICSICT 2008
CountryChina
CityBeijing
Period10/20/0810/23/08

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