A novel RF phase error built-in-self-test for GSM

D. Webster; R. Hudgens; L. Phan; O. Eliezer; D. Y.C. Lie

doi:10.1109/ICSICT.2008.4734985

A novel RF phase error built-in-self-test for GSM

D. Webster, R. Hudgens, L. Phan, O. Eliezer, D. Y.C. Lie

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

3 Scopus citations

Abstract

This paper discusses a novel RF Built-in-Self-Test (RF-BiST) targeting to replace the traditionally expensive and time-consuming RF parametric phase error test on a GSM/EDGE Digital Radio Processor (DRP) radio transceiver. The verification of the RF BiST in a production environment and a comparison of the internal BiST vs. the current test in are presented, which validates the RF BiST as an accepted test method for determining the phase error of GSM devices. The results illustrate that there are great opportunities in reduction of test time and costs by moving to the internal digital method of BiST for testing RF/analog IC products. copy; 2008 IEEE.

Original language	English
Title of host publication	ICSICT 2008 - 2008 9th International Conference on Solid-State and Integrated-Circuit Technology Proceedings
Pages	2075-2078
Number of pages	4
DOIs	https://doi.org/10.1109/ICSICT.2008.4734985
State	Published - Dec 1 2008
Event	2008 9th International Conference on Solid-State and Integrated-Circuit Technology, ICSICT 2008 - Beijing, China Duration: Oct 20 2008 → Oct 23 2008

Publication series

Name	International Conference on Solid-State and Integrated Circuits Technology Proceedings, ICSICT

Conference

Conference	2008 9th International Conference on Solid-State and Integrated-Circuit Technology, ICSICT 2008
Country	China
City	Beijing
Period	10/20/08 → 10/23/08

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Cite this

Webster, D., Hudgens, R., Phan, L., Eliezer, O., & Lie, D. Y. C. (2008). A novel RF phase error built-in-self-test for GSM. In ICSICT 2008 - 2008 9th International Conference on Solid-State and Integrated-Circuit Technology Proceedings (pp. 2075-2078). [4734985] (International Conference on Solid-State and Integrated Circuits Technology Proceedings, ICSICT). https://doi.org/10.1109/ICSICT.2008.4734985

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title = "A novel RF phase error built-in-self-test for GSM",

abstract = "This paper discusses a novel RF Built-in-Self-Test (RF-BiST) targeting to replace the traditionally expensive and time-consuming RF parametric phase error test on a GSM/EDGE Digital Radio Processor (DRP) radio transceiver. The verification of the RF BiST in a production environment and a comparison of the internal BiST vs. the current test in are presented, which validates the RF BiST as an accepted test method for determining the phase error of GSM devices. The results illustrate that there are great opportunities in reduction of test time and costs by moving to the internal digital method of BiST for testing RF/analog IC products. copy; 2008 IEEE.",

author = "D. Webster and R. Hudgens and L. Phan and O. Eliezer and Lie, {D. Y.C.}",

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Webster, D, Hudgens, R, Phan, L, Eliezer, O & Lie, DYC 2008, A novel RF phase error built-in-self-test for GSM. in ICSICT 2008 - 2008 9th International Conference on Solid-State and Integrated-Circuit Technology Proceedings., 4734985, International Conference on Solid-State and Integrated Circuits Technology Proceedings, ICSICT, pp. 2075-2078, 2008 9th International Conference on Solid-State and Integrated-Circuit Technology, ICSICT 2008, Beijing, China, 10/20/08. https://doi.org/10.1109/ICSICT.2008.4734985

A novel RF phase error built-in-self-test for GSM. / Webster, D.; Hudgens, R.; Phan, L.; Eliezer, O.; Lie, D. Y.C.

ICSICT 2008 - 2008 9th International Conference on Solid-State and Integrated-Circuit Technology Proceedings. 2008. p. 2075-2078 4734985 (International Conference on Solid-State and Integrated Circuits Technology Proceedings, ICSICT).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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T1 - A novel RF phase error built-in-self-test for GSM

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AB - This paper discusses a novel RF Built-in-Self-Test (RF-BiST) targeting to replace the traditionally expensive and time-consuming RF parametric phase error test on a GSM/EDGE Digital Radio Processor (DRP) radio transceiver. The verification of the RF BiST in a production environment and a comparison of the internal BiST vs. the current test in are presented, which validates the RF BiST as an accepted test method for determining the phase error of GSM devices. The results illustrate that there are great opportunities in reduction of test time and costs by moving to the internal digital method of BiST for testing RF/analog IC products. copy; 2008 IEEE.

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Webster D, Hudgens R, Phan L, Eliezer O, Lie DYC. A novel RF phase error built-in-self-test for GSM. In ICSICT 2008 - 2008 9th International Conference on Solid-State and Integrated-Circuit Technology Proceedings. 2008. p. 2075-2078. 4734985. (International Conference on Solid-State and Integrated Circuits Technology Proceedings, ICSICT). https://doi.org/10.1109/ICSICT.2008.4734985

Access to Document

10.1109/ICSICT.2008.4734985

Link to publication in Scopus