@article{d65a7df6db7647008307ef5ebe4bb82d,
title = "A new metal-to-metal antifuse with amorphous carbon",
abstract = "We report the development of a new metal-to-metal antifuse with amorphous carbon as the dielectric. Amorphous carbon antifuses have several characteristics making them superior to amorphous silicon antifuses, including lower values of OFF-state leakage current, ON-state resistance, dielectric constant, and breakdown voltage. Most importantly, amorphous carbon antifuses do not show ON-OFF switching, which is observed in amorphous silicon antifuses. A new model is proposed to explain the breakdown mechanism and ON-state reliability of amorphous carbon antifuses.",
keywords = "Amorphous carbon, Antifuse, FPGA",
author = "S. Liu and D. Lamp and S. Gangopadhyay and G. Sreenivas and Ang, {S. S.} and Naseem, {H. A.}",
note = "Funding Information: Manuscript received May 30, 1997; revised May 18, 1998. This work was supported by the Texas Advanced Technology program and the National Science Foundation. S. Liu, D. Lamp, and S. Gangopadhyay are with the Department of Physics, Texas Tech University, Lubbock, TX 79409 USA (e-mail: gango@ttacs.ttu.edu). G. Sreenivas, S. S. Ang, and H. A. Naseem are with the Department of Electrical Engineering, University of Arkansas, Fayetteville, AR 72701 USA. Publisher Item Identifier S 0741-3106(98)06719-6.",
year = "1998",
month = sep,
doi = "10.1109/55.709626",
language = "English",
volume = "19",
pages = "317--319",
journal = "IEEE Electron Device Letters",
issn = "0741-3106",
number = "9",
}