“A Fully-Integrated Highly-Efficient RF Class E SiGe Power Amplifier with an Envelope-Tracking Technique for EDGE Applications”, D.Y.C. Lie, J. D. Popp, F. Wang, D. Kimball, and L.E. Larson, Proc. IEEE Sixth Dallas Circuits and Systems Workshop (DCAS‘07), pp. 39-42, Nov. 15-16, Dallas (2007)

Yu-Chun Lie

“A Fully-Integrated Highly-Efficient RF Class E SiGe Power Amplifier with an Envelope-Tracking Technique for EDGE Applications”, D.Y.C. Lie, J. D. Popp, F. Wang, D. Kimball, and L.E. Larson, Proc. IEEE Sixth Dallas Circuits and Systems Workshop (DCAS‘07), pp. 39-42, Nov. 15-16, Dallas (2007)

Electrical and Computer Engineering

Research output: Contribution to conference › Paper › peer-review

Abstract

“A Fully-Integrated Highly-Efficient RF Class E SiGe Power Amplifier with an Envelope-Tracking Technique for EDGE Applications”, D.Y.C. Lie, J. D. Popp, F. Wang, D. Kimball, and L.E. Larson, Proc. IEEE Sixth Dallas Circuits and Systems Workshop (DCAS‘07), pp. 39-42, Nov. 15-16, Dallas (2007)

Original language	English
State	Published - Nov 2007

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title = "“A Fully-Integrated Highly-Efficient RF Class E SiGe Power Amplifier with an Envelope-Tracking Technique for EDGE Applications”, D.Y.C. Lie, J. D. Popp, F. Wang, D. Kimball, and L.E. Larson, Proc. IEEE Sixth Dallas Circuits and Systems Workshop (DCAS{\textquoteleft}07), pp. 39-42, Nov. 15-16, Dallas (2007)",

abstract = "“A Fully-Integrated Highly-Efficient RF Class E SiGe Power Amplifier with an Envelope-Tracking Technique for EDGE Applications”, D.Y.C. Lie, J. D. Popp, F. Wang, D. Kimball, and L.E. Larson, Proc. IEEE Sixth Dallas Circuits and Systems Workshop (DCAS{\textquoteleft}07), pp. 39-42, Nov. 15-16, Dallas (2007)",

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“A Fully-Integrated Highly-Efficient RF Class E SiGe Power Amplifier with an Envelope-Tracking Technique for EDGE Applications”, D.Y.C. Lie, J. D. Popp, F. Wang, D. Kimball, and L.E. Larson, Proc. IEEE Sixth Dallas Circuits and Systems Workshop (DCAS‘07), pp. 39-42, Nov. 15-16, Dallas (2007). / Lie, Yu-Chun.

2007.

Research output: Contribution to conference › Paper › peer-review

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