A conductive AFM study of carbon-rich hexagonal (BN)C semiconductor alloys

N. Khan, M. R. Uddin, J. Li, J. Y. Lin, H. X. Jiang

Research output: Contribution to journalArticlepeer-review

Abstract

The conductive atomic force microscopy was employed to map different phases and their boundaries to provide insights into phase separation mechanisms in carbon-rich h-(BN)C alloys. One of three phases identified, had the highest average current of about 0.85 μA, second with no current (0 μA), and a third phase with an average current of about 0.3 μA, corresponding to the pure graphite (h-C), pure (h-BN) and the h-(BN)C random alloy phases, respectively. Two other phases, with an average current of about 0.15 μA and 0.6 μA, were identified to be most likely the boundaries between phases and alloys. Graphical abstract: [Figure not available: see fulltext.]

Original languageEnglish
Pages (from-to)223-228
Number of pages6
JournalMRS Communications
Volume12
Issue number2
DOIs
StatePublished - Apr 2022

Keywords

  • Atom probe microscopy
  • Electrical properties
  • Heterogenous
  • Insulator
  • Metalorganic deposition

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