5 × 5 scattered temperature sensor front-end based on single-doide with non-trimmed ±0.7°C 3σ relative inaccuracy

Bozorgmehr Vosooghi, Lu Li, Changzhi Li

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

A bipolar junction transistor (BJT)-based scattered relative temperature sensor front-end with a 5 × 5 remote sensor node array in 180 nm CMOS process is presented. To eliminate diode mismatches and reduce the sensor node area, a single-diode approach that accurately switches different amounts of currents into a single PNP BJT is employed. Dynamic element matching (DEM) is applied to the current mirrors so that the current ratio is precisely controlled. The 5 × 5 sensor nodes with a unit size of only 15 × 10 μm2 are distributed across the chip. Experimental results show that the minimum supply voltage (analogue) is 1 V over a temperature range of 0-125°C. The measured 3σ relative inaccuracy was <±0.7°C without trimming across the 0-125°C temperature range while drawing a current of < 22 μA. Furthermore, the multi-location thermal monitoring function has been demonstrated experimentally and a 4°C/mm on-chip temperature gradient was detected.

Original languageEnglish
Pages (from-to)1806-1808
Number of pages3
JournalElectronics Letters
Volume50
Issue number24
DOIs
StatePublished - Nov 1 2014

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