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Dive into the research topics where Stephen Bayne is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Internet of Networked Microgrids Solution for Scalable Agile Microgrids
08/15/20 → …
Project: Research
Scholarly Research
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Centralized Control Topology for PV Farms Shading Detection and GMPP Searching Restarting Condition
Negri, C. A., Daneshvardehnavi, S., Schmitt, K. E. K., Esmaeel Nezhad, A., Nardelli, P. H. J., Bayne, S. & Giesselmann, M. G., 2022, In: IEEE Access. 10, p. 28991-29008 18 p.Research output: Contribution to journal › Article › peer-review
Open Access -
Centralized Control Topology for PV Farms Shading Detection and GMPP Searching Restarting Condition
Negri, C., Daneshvardehnavi, S., Konrad Erich, K. S., Nezhad, A. E., Nardelli, P. H. J., Bayne, S. & Giesselmann, M., Mar 10 2022, In: IEEE Access.Research output: Contribution to journal › Article › peer-review
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Centralized Control Topology for PV Farms Shading Detection and GMPP Searching Restarting Condition
Negri, C., Daneshvardehnavi, S., Konrad Erich, K. S., Nezhad, A. E., Nardelli, P. H. J., Bayne, S. & Giesselmann, M., Mar 10 2022, In: IEEE Access.Research output: Contribution to journal › Article › peer-review
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Dynamic Voltage Restorer (DVR) with a novel robust control strategy
DaneshvarDehnavi, S., Negri, C., Bayne, S. & Giesselmann, M., Feb 2022, In: ISA Transactions. 121, p. 316-326 11 p.Research output: Contribution to journal › Article › peer-review
2 Scopus citations -
Evaluation of GaN HEMTs in H3TRB Reliability Testing
Rodriguez, J. A., Tsoi, T., Graves, D. & Bayne, S. B., May 1 2022, In: Electronics (Switzerland). 11, 10, 1532.Research output: Contribution to journal › Article › peer-review
Open Access
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SiC Power Semiconductor Device Reliability and Accelerated Testing
Stephen Bayne (Speaker)
Nov 1 2021 → Nov 30 2021Activity: Talk or presentation › Oral presentation
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Overview of TTU Research
Stephen Bayne (Speaker)
Jul 1 2021 → Jul 31 2021Activity: Talk or presentation › Invited talk
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SiC Power Semiconductor Device Reliability and Accelerated Testing
Stephen Bayne (Speaker)
Oct 1 2021 → Oct 31 2021Activity: Talk or presentation › Oral presentation
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SiC Power Semiconductor Device Reliability and Accelerated Testing
Stephen Bayne (Speaker)
Apr 1 2020 → Apr 30 2020Activity: Talk or presentation › Oral presentation
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SiC Power Semiconductor Device Reliability and Accelerated Testing
Stephen Bayne (Speaker)
Mar 1 2020 → Mar 31 2020Activity: Talk or presentation › Oral presentation