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Christopher Monico

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20002023

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  • 2009

    Markov source based test length optimized SCAN-BIST architecture

    Farooqi, A., Gale, R. O., Reddy, S. M., Nutter, B. & Monico, C., 2009, Proceedings of the 10th International Symposium on Quality Electronic Design, ISQED 2009. p. 708-713 6 p. 4810380. (Proceedings of the 10th International Symposium on Quality Electronic Design, ISQED 2009).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    1 Scopus citations