Assessing the Role of Non-Local Trap-to-Band Impact Ionization in 4H-SiC Photoconductive Switches Containing Deep Defects Aimed at Enhanced Hold-off Voltages

Neuber, A. (Speaker)

Activity: Talk or presentationOral presentation

PeriodJul 1 2016Jul 31 2016
Held atIEEE International Power Modulator and High Voltage Engineering Conference
Degree of RecognitionInternational